2003 IEEE nuclear and space radiation effects ... - IEEE Xplore

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, VOL. 50, NO. 6, DECEMBER 2003

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2003 IEEE Nuclear and Space Radiation Effects Conference Outstanding Conference Paper Award

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HE recipients of the 2003 IEEE NSREC Outstanding Paper Award are Dale McMorrow, William Lotshaw, Joseph Melinger, Steve Buchner, Younes Boulghassoul, Lloyd Massengill, and Ron Pease for their paper entitled “Three-Dimensional Mapping of Single Event Effects Using Two Photon Absorption.” This work describes the application of a new technique, twophoton absorption, to examine single event effects in a semi-

Digital Object Identifier 10.1109/TNS.2003.822129

conductor device. In two-photon absorption, a laser is used in which the wavelength is chosen to be lower than the bandgap of the semiconductor so that no carriers are generated at low intensities. However, at high intensities, the material can absorb two photons simultaneously to generate a single electron-hole pair. This allows tight control over where the carrier generation occurs, and provides for charge injection at any depth within the device structure permitting three-dimensional mapping of single event effects sensitivity of the device. In this work, the technique is developed and an example map is shown for single event transients in an LM124 operational amplifier.

Dale McMorrow received the B.S. degree in chemistry from Spring Hill College, Mobile, AL, in 1979, and the Ph.D. degree in physical chemistry from The Florida State University, Tallahassee, FL, in 1985. His graduate studies focused on the role of intermolecular structure and dynamics in shaping the excitation and relaxation processes of molecular species, with an emphasis on excited-state intramolecular proton transfer processes. After a postdoctoral fellowship at the University of Toronto he joined the technical staff at the Naval Research Laboratory in December 1988. His current research interests include use of ultrafast nonlinear-optical spectroscopic techniques to probe the details of intermolecular dynamics and excited-state photophysical processes of liquids, solutions, and glasses, the development and characterization of laser-based methodologies for simulating single-event phenomena (space radiation effects) in microelectronic devices and complex integrated circuits and, most recently, the development of two-photon absorption as a tool for interrogating single-event phenomena. Recent emphasis has been on characterization of the physical mechanisms responsible for the single-event response of III-V semiconductor devices, and development of the pulsed laser technique as a practical screening tool for single-event transient phenomena in bipolar linear circuits. Dale has served as a session chair at the IEEE Nuclear and Space Radiation Conference (NSREC) and the Single-Event Effects Symposium, and is currently serving as Technical Chair for the Single-Event Effects Symposium. He is a member of the American Chemical Society, the Optical Society of America, and the Association for the Advancement of Science.

William T. Lotshaw received the B.S. degree in biochemistry from the University of California, Davis, in 1978, and the Ph.D. in 1984 from the University of Chicago in biophysics/physical chemistry. From 1984 to 1989 he was a Research Associate in the Department of Chemistry at the University of Toronto. In 1989 he became a member of the technical staff at the General Electric Research and Development Center in Niskayuna, NY, where he worked on ultrafast solid-state lasers, high power solid-state lasers and laser materials processing, high power nonlinear optics, and ultrafast laser spectroscopy. Since 2001 he has worked as an independent contractor in the Electronics Science and Technology Division of the Naval Research Laboratory in Washington, DC, and as a consultant on ultrafast laser technology and applications.

0018-9499/03$17.00 © 2003 IEEE

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Joseph S. Melinger received the Ph.D. degree in physical chemistry from Cornell University in 1989. From 1989 to 1991 he was a postdoctoral research associate in the Chemistry Department at Princeton University. In 1991 he joined the Naval Research Laboratory, Washington, DC as a research associate, and is currently a staff scientist in the Electronics Science and Technology. His research interests focus on the study of ultrafast light-induced processes in molecular systems. He has also been involved in the development and understanding of pulsed-laser probes of singleevent effects in semiconductor devices.

Stephen P. Buchner (M’94) received the B.A. degree in physics from Princeton University in 1968, and the Ph.D. degree in physics from the University of Pennsylvania in 1975 in the area of light scattering. From 1976 to 1977 he was a post-doctoral fellow in the Physics Department at the University of Maryland doing research in magneto-optics. In 1997 he joined Martin Marietta Laboratories in Baltimore, MD, where he initially did research in the area of infrared detectors. In support of a factory started by Martin Marietta to produce radiation hardened circuits, he began an effort to use pulsed lasers to test circuits for their sensitivity to single event effects. In 1991 he received the Jefferson Cup from Martin Marietta Corporation for the outstanding corporate publication. In 1993 he left Martin Marietta Laboratories to join the Naval Research Laboratory in Washington, DC, where he continued the developing of the pulsed laser as a probe of single event effects. He is currently at NASA-GSFC in Greenbelt, MD, where he works in the Radiation Effects and Analysis Group. He was a Session Chairman at NSREC in 1994 and a short course presenter in 2001. He was also the recipient of the best paper award at the 2001 Hardened Electronics and Radiation Technology (HEART) Conference. He has authored or co-authored more than 90 papers in refereed journals. Stephen is a member of NPSS.

Younes Boulghassoul (S’01) received the B.S. and M.S. degrees in electrical engineering from Montpellier 2 University, Montpellier, France, in 1999 and 2000, respectively. He then joined the Radiation Effects and Reliability Group at Vanderbilt University, Nashville, TN, where he received in 2002 his second M.S. degree in electrical engineering. He is currently a research assistant at Vanderbilt and is working on the Ph.D. degree in Electrical Engineering. At the LIRMM and the Electronique et Rayonnement laboratories, France, he worked on the floating gate effect in CMOS technology and its application to logic inverters, and he contributed to the development of heavy-ion modules for computer simulation. At Vanderbilt University, he has participated in fundamental studies of analog single event transient (ASET) phenomena in analog circuits and he is extending his interests to advanced mixed-signal circuits in aggressively scaled fabrication technologies. Younes has authored or co-authored 15 journal and proceeding publications and was the recipient of the Paul Phelps Continuing Education Grant at the 2002 IEEE Nuclear and Space Radiation Effect Conference. Younes is a member of the NPSS.


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Lloyd W. Massengill (S’80-M’87-SM’00) received the B.S., M.S., and Ph.D. degrees in electrical engineering from North Carolina State University. In 1987 he joined Vanderbilt University, where he serves as professor of Electrical and Computer Engineering. He also presently serves as Director of Engineering for the Vanderbilt Institute for Space and Defense Electronics. Prof. Massengill has been involved in the area of microelectronic circuit modeling and design for space and strategic environments, with a particular emphasis on the modeling of transient radiation effects. He has worked on the analysis of single event and dose-rate radiation effects on integrated circuits (including the discovery of the rail span collapse dose-rate failure mechanism), the development of CAD tools and models for radiation effects, the design of radiation-hardened circuitry, and the analysis of soft error effects in CMOS, SOI, and bipolar technologies. Prof. Massengill has served the Nuclear and Space Radiation Effects Conference as Technical Program Chairman, Short Course Chairman, Short Course Speaker, and Session Chairman. He has also served as Guest Editor for the special NSREC issue of the IEEE TRANSACTIONS ON NUCLEAR SCIENCE.

Ron Pease received the B.S. degree in physics from Indiana University in 1965, graduating cum laude. From 1966-1977 he worked at what is now NAVSEA Crane (Crane Indiana), performing hardness assurance testing of missile components. During this time (1973) he had a temporary assignment at Sandia Labs where he performed testing and analysis of total dose effects in bipolar and CMOS devices and circuits. After two years with BDM in Albuquerque he joined MRC/Albuquerque in 1979 where he moved from the technical staff to Division Manager then to Chief Scientist of the Microelectronics Division. In 1993, he left MRC to form RLP Research where he is currently President and sole employee. Ron has performed testing, analysis and modeling of dose rate, total dose, displacement damage and single event effects in semiconductor devices and circuits with an emphasis in the past few years on bipolar linear circuits. He has been involved in the development of many hardness assurance test methods and guidelines and served as a Short Course Instructor on hardness assurance at this year’s NSREC. Ron has authored over 90 refereed journal publications and won the NSREC Outstanding Conference Paper in 1977, 1983, and 2002. He has held every technical position on the NSREC Committee and served as Conference Chairman in 2000. He has been a Member at Large and Publications Chairman of the Radiation Effects Steering Group and is currently serving a second term as Member at Large.