J. A. Felix, P. Paillet, V. Ferlet-Cavrois, J. Baggio, R. A. Reed, ... to Heavy Ion Irradiation, J. A. Felix, M. R. Shaneyfelt, ... Stuart Huston Huston Associates.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, VOL. 54, NO. 6, DECEMBER 2007
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2007 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the Chairman
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T is a longstanding tradition of the IEEE Nuclear and Space Radiation Effects Conference (NSREC) to honour the Outstanding Conference Paper as well as the Outstanding Data Workshop Presentation. In recent years recognition has also been given to the best paper presented and first-authored by an IEEE Student Member. The stated goal of the awards process is not only to reward authors of particularly high quality and important work, but to encourage all authors to produce presentations and manuscripts of high technical quality, clarity of presentation, and significance to the community. As in previous years, this difficult selection process began at the conference, where the Awards Committee selected the candidate papers based on the conference presentations (both oral and poster). At least four committee members judged each conference session, carefully scoring each paper on the basis of technical quality, originality, clarity of presentation, and significance to the community. This year the Awards Committee had 18 members, with each member scoring between 20 and 30 papers at the conference. At the conclusion of the conference, the committee met to tally and discuss the scores and as a result 10 papers were chosen as candidates for the Outstanding Conference Paper Award. In addition, during the conference each committee member also evaluated each Radiation Effects Data Workshop presentation for selection of the Outstanding Data Workshop Presentation Award. The top three highest scored papers presented by IEEE Student Members were also selected to be considered for the Outstanding Student Paper Award. Following the conference, the manuscripts of the 10 nominated papers, as well as the 3 student papers, were reviewed and scored using the same criteria as mentioned above. This was a time-consuming and difficult process, requiring each committee member to thoughtfully read and consider 11 papers during August and September. As always, many excellent papers were nominated and the top five all scored well. However, in the end one paper stood out as the winner. Accordingly, I am pleased to announce that the winner of the 2007 NSREC Outstanding Conference Paper Award is: Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits, P. E. Dodd, J. R. Schwank, M. R. Shaneyfelt, J. A. Felix, P. Paillet, V. Ferlet-Cavrois, J. Baggio, R. A. Reed, K. M. Warren, R. A. Weller, R. D. Schrimpf, G. L. Hash, S. M. Dalton, K. Hirose, and H. Saito. The winner of the 2007 Outstanding Student Paper Award also rated very highly amongst all the finalist papers and is: Digital Object Identifier 10.1109/TNS.2007.912282
Mechanisms of Enhanced Radiation-Induced Degradation due to Excess Molecular Hydrogen in Bipolar Oxides, X. J. Chen, H. J. Barnaby, B. Vermeire, K. Holbert, D. Wright, R. L. Pease, G. Dunham, D. G. Platteter, J. Seiler, S. McClure, and P. Adell. The clear winner of the 2007 Outstanding Data Workshop Presentation Award is: Compendium of Current Single Event Effects Results for Candidate Spacecraft Electronics for NASA, M. V. O’Bryan, C. F. Poivey, K. A. LaBel, S. P. Buchner, R. L. Ladbury, T. R. Oldham, J. W. Howard, Jr., A. B. Sanders, M. D. Berg, and J. L. Titus. I would like personally to congratulate all the winning authors as well as all the authors of the nominated finalist papers. In addition I most warmly thank all of the members of this year’s Awards Committee for their hard work and dedication to this difficult task during the summer months. I am indebted to each committee member for providing such willing and friendly assistance and for giving their time to read and objectively score the presentations and papers. Nominated Papers Quantum Mechanical Description of Displacement Damage Formation, M. J. Beck, R. Hatcher, R. D. Schrimpf, D. M. Fleetwood and S. T. Pantelides. Mechanisms of Enhanced Radiation-Induced Degradation due to Excess Molecular Hydrogen in Bipolar Oxides, X. J. Chen, H. J. Barnaby, B. Vermeire, K. Holbert, D. Wright, R. L. Pease, G. Dunham, D. G. Platteter, J. Seiler, S. McClure, and P. Adell. Model for Cumulative Solar Heavy Ion Energy and Linear Energy Transfer Spectra, M. A. Xapsos, C. Stauffer, T. Jordan, J. L. Barth, and R. Mewaldt. An Evaluation of Transistor-Layout RHBD Techniques for SEE Mitigation in SiGe HBTs, A. Sutton, M. Bellini, J. D. Cressler, J. A. Pellish, R. A. Reed, P. W. Marshall, G. Niu, G. Vizkelethy, M. Turowski, A. Raman. The Effects of Hydrogen in Hermetically Sealed Packages on the Total Dose and Dose Rate Response of Bipolar Linear Circuits, R. L. Pease, D. G. Platteter, G. W. Dunham, J. E. Seiler, S. S. McClure, H. J. Barnaby, and X. J. Chen. Enhanced Degradation in Power MOSFET Devices Due to Heavy Ion Irradiation, J. A. Felix, M. R. Shaneyfelt, J. R. Schwank, S. M. Dalton, P. E, Dodd, and J. B. Witcher. Metrics for Comparison between Displacement Damage due to Ion Beam and Neutron Irradiation in Silicon BJTs, E, Bielejec, G. Vizkelethy, R. M. Fleming, and D. B. King.
0018-9499/$25.00 © 2007 IEEE
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IEEE TRANSACTIONS ON NUCLEAR SCIENCE, VOL. 54, NO. 6, DECEMBER 2007
Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits, P. E. Dodd, J. R. Schwank, M. R. Shaneyfelt, J. A. Felix, P. Paillet, V. Ferlet-Cavrois, J. Baggio, R. A. Reed, G. L. Hash, S. M. Dalton, K. Hirose, and H. Saito. Angular Dependence of Heavy Ion Effects in Floating Gate Memory Arrays, G. Cellere, A. Paccagnella, A. Visconti, M. Bonanomi, R. Harboe-Sorensen, A. Virtanen. Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator Latches and Memory Cells, K. P. Rodbell, D. F. Heidel, H. H. K. Tang, M. S. Gordon, P. Oldiges and C. Murray. Nominated Student Papers Mechanisms of Enhanced Radiation-Induced Degradation due to Excess Molecular Hydrogen in Bipolar Oxides, X. J. Chen, H. J. Barnaby, B. Vermeire, K. Holbert, D. Wright, R. L. Pease, G. Dunham, D. G. Platteter, J. Seiler, S. McClure, and P. Adell. An Evaluation of Transistor-Layout RHBD Techniques for SEE Mitigation in SiGe HBTs, A. Sutton, M. Bellini, J. D. Cressler, J. A. Pellish, R. A. Reed, P. W. Marshall, G. Niu, G. Vizkelethy, M. Turowski, A. Raman. Characterization of Digital Single Event Transient Pulse Widths in 130 nm and 90 nm CMOS, B. Narasimham, B. L. Bhuva, R. D. Schrimpf, L. W. Massengill, M. J. Gadlage, O. A. Amusan,
W. T. Holman, A. F. Witulski, W. H. Robinson, J. D. Black, J. M. Benedetto, P. H. Eaton. Awards Committee Members Philippe Adell NASA-JPL Jacques Baggio CEA-DIF Ewart Blackmore TRIUMF Dan Fleetwood Vanderbilt University Dave Hiemstra MDA Stuart Huston Huston Associates Allan Johnston NASA-JPL Gary Lum Lockheed Martin Peter McNulty Clemson University Eugene Normand Boeing Consultant Alessandro Paccagnella Universita di Padova Les Palkuti DTRA Ron Pease RLP Research Jim Pickel PRT Inc Robert Reed Vanderbilt University Marty Shaneyfelt Sandia National Labs Mayrant Simons RTI International Mike Xapsos NASA-GSFC CLIVE DYER Centre for Radiation Environments, Effects and Hardening, Space Division QinetiQ, Farnborough, GU14 0LX, U.K.
