Modelling of. Coupled Electrostatic Microsystems ... Gilbert, J. R., Ananthasuresh,
G. K., and Senturia, S. .... S. D. Senturia, Microsystems Design, Kluwer, 2001.
Modelling of Coupled Electrostatic Microsystems G. K. Ananthasuresh Professor, Mechanical Engineering Indian Institute of Science Bangalore, India
[email protected]
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Pull‐in phenomenon (review) Condition for critical stability
V1 < V2 < V3
Potential energy
g0 / 3
g0
3 ( ) 0 AV 2 k g x 2 ( PE ) 2 0 0 V k 0 A x 2 ( g 0 x) 3 k ( g 0 x) g0 1 0 A 2 kx V x 2 2 g 0 x 2 3
x
V pull in
8 k g 30
27 0 A
x
2g0 / 3
Vpull in Vpull in G.K. Ananthasuresh, Indian Institute of Science
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With a dielectric layer: pull‐up and hysteresis (review) Vpull in
td 8k g 0 27 0 A r
3
Dielectric layer x
Vpull up
g0 td
g0
td 2k g 0 0 A r
2
x
Pull‐up voltage is found by equating the forces of spring and electrostatics at .x g 0 Gilbert, J. R., Ananthasuresh, G. K., and Senturia, S. D., “3‐D Modeling and Simulation of Contact Problems and Hysteresis in Coupled Electromechanics,” presented at the IEEE‐MEMS‐96 Workshop, San Diego, CA, Feb. 11‐15, 1996.
Vpull up Vpull in V G.K. Ananthasuresh, Indian Institute of Science
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Pull‐in phenomenon used in a display device www.iridigm.com (a QualComm acquisition) Interference‐modulation by electrostatic actuation of vertically moving membranes.
G.K. Ananthasuresh, Indian Institute of Science
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What about dynamic behavior? Vdynamic pull -in = dynamic pull‐in voltage
Frequency =
Potential energy
g0 V
t
Lumped 1‐dof model
x
mx kx
0 AV 2
2( g 0 x ) 2
Beam model
0 wV 2 d 4u 0 wt u EI 4 2 dx 2( g 0 u )
V 2 (Vdc Vac sin t ) 2 Vdc2 2VdcVac sin t Vac2 sin 2 t Will contain a term! 2
So, the response will show two resonance at two frequencies.
G.K. Ananthasuresh, Indian Institute of Science
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Damping
V
Lumped 1‐dof model
mx bx kx
0 AV
Beam model
2
2( g 0 x ) 2
0 wV 2 d 4u wt u bu EI 4 0 2 dx 2( g 0 u )
b How do you obtain ?
G.K. Ananthasuresh, Indian Institute of Science
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Squeezed film effect
Squeezed‐film damping
V
Lumped 1‐dof model
mx bx kx
0 AV
Beam model
2
2( g 0 x ) 2
0 wV 2 d 4u wt u bu EI 4 0 2 dx 2( g 0 u )
b How do you obtain ? Use isothermal, compressible, narrow gap Reynolds equation to model the film of air beneath the beam/plate/membrane. It is widely used in lubrication theory. By analyzing this equation, we can extract the essence of damping as a lumped parameter – the so called “macromodeling”. G.K. Ananthasuresh, Indian Institute of Science
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Modeling squeezed film effects: isothermal Reynolds equation Pressure distribution in the 2‐D x‐y plane
Gap varies in the x‐y plane for a deformable structure (beam,plate, membrane)
1 p ( x, y ) g ( x, y ) p ( x , y ) g ( x , y ) 3 p ( x , y ) t 12
Viscosity of air
For lumped 1‐dof modeling, we have a rigid plate. So,
g
does not depend on . ( x, y )
g3 p ( x, y ) g g 3 p ( x , y ) p ( x , y ) t 12 12
1 2 2 p x y ( , ) 2
Assume further that pressure distribution is the same along the length of the plate so that it becomes a one dimensional problem.
p( y) g g t 12 3
1 2 2 p ( y) 2
Assumed pressure distribution
x
y
S. D. Senturia, Microsystems Design, Kluwer, 2001. G.K. Ananthasuresh, Indian Institute of Science
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Behavior with small displacements p( y) g g 3 Linearize t 12 p p0 p
1 2 2 ( p0 , g 0 ) p ( y ) around : 2
g g 0 g
y p g , gˆ Also, use non‐dimensional variables: , pˆ w p0 g0 g 02 p0 2 pˆ gˆ g 02 p0 2 pˆ g pˆ width 2 2 2 2 t 12 w t 12 w g0 pˆ ( , t ) ~ p ( ) e t Separation of spatial and temporal components: g 02 p0 2 ~ p g ~ p 2 2 12 w g 0 e t Assume a sudden velocity impulse to the plate. Then, for t > 0, this term is zero.
(with displacement ) x x0
G.K. Ananthasuresh, Indian Institute of Science
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Behavior with small displacements (contd.)
2 g 02 p0 2 ~ p 12 w n ~ ~ p 0 p An sin n Bn cos n n 2 2 12 w g 02 p0
Boundary conditions and velocity‐impulse assumption give:
g 02 p0 n 2 2 n n ; n ; n 1,3,5,... 2 12 w x0 4 n t An sin( n ) e g 0 odd n n 1
Force on the plate =
x0 8 nt f sq (t ) p0 wl pˆ (t , ) d p0 wl 2 2e g 0 odd n n 0
Take the Laplace transform (continued on the next slide). G.K. Ananthasuresh, Indian Institute of Science
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Finally, getting to lumped approximation… 3 96 l w 1 1 Fsq ( s ) 4 3 4 g 0 odd n n 1 s n
96 l w3 1 Fsq ( s ) 4 g 03 1 s
sX ( s )
c
96 l w3 b 4 g 03
3 96 l w x 4 3 0 g0
b 1
s
sX ( s )
c
2 g 02 p0 c 12 w2
1 1 4 odd n n 1 s n
For only. n 1
Transfer function for general displacement input!
Rb
f sq (t ), Fsq ( s )
x(t ), X ( s ) Damping coefficient
Cut‐off frequency
sX ( s )
C 1
bc
G.K. Ananthasuresh, Indian Institute of Science
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What does it mean mechanically? 96 l w3 b 4 g 03
k
m x
8wp0 k sq bc 2 g0
x
Thus, squeezed film effect creates two effects: Viscous damping + “air‐spring” Further analysis indicates that at low frequencies, damping dominates, and air‐spring at high frequencies. See S. D. Senturia, Microsystems Design, Kluwer, 2001, for details. G.K. Ananthasuresh, Indian Institute of Science
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Move up to beam modeling… p ( x, y, t ) {g 0 u ( x, t )} 1 p ( x, y, t ) {g 0 u ( x, t )}3 p ( x, y, t ) t 12
0 wV 2 (t ) d 4 u ( x, t ) u ( x, t ) w / 2 wt p ( x, y, t ) dy EI 0 2 2 4 dx t 2{g 0 u ( x, t )} w / 2 Solve these two coupled equations.
Note that this is still a parallel‐plate approxmation!
An approach Use FDM for pressure equation and FEM or FDM for discretizing the dynamic equation, and integrate in time using the Runge‐Kutta method. G.K. Ananthasuresh, Indian Institute of Science
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FD solution of Reynolds equation ( Pg ) .( g 3 PP) 12 t 2 2 P g 3 P P Pg 2 t 12 x y 12
2 P 2 P 3Pg 2 2 x 12 x
P g P g P P x . x y . y g t
G.K. Ananthasuresh, Indian Institute of Science
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A typical beam’s response with squeezed film effect The transverse deflection of the mid‐point of a fixed‐fixed beam under (Vdc+Vac) voltage input under the squeezed film effect:
u mid point
t
G.K. Ananthasuresh, Indian Institute of Science
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What about this problem now? V
Diaphragm
Flow rate
Passive inlet valve
V sin t
Passive outlet valve
Frequency
A problem involving three energy domains that are strongly coupled. Furthermore, the fluids part is non‐trivial. G.K. Ananthasuresh, Indian Institute of Science
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Main points
MEMS are systems that tightly integrate many energetic phenomena, which makes their modeling non‐trivial. Coupled multi‐physics equations need to be solved. Reduced order lumped “macro” models are useful for design and system‐level simulation
G.K. Ananthasuresh, Indian Institute of Science